The SUPERSPECTRA 3 is a thickness measurement system for analysing large area thin coatings and functional layers. Ist principble bases on the reflectometric measurement technique. This low energy optical principle is completely non-destructive.
The SUPERSPECTRA 3 identifies the thickness of transparent materials on a wide range of substrates. Combining nanometer thickness resolution with a topography analysis of large areas makes the SUPERSPECTRA 3 a versatile solution for many measuring applications.
Short measurement time
Nanometer thickness resolution
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