Superspectra 3

LARGE AREA THIN FILM MEASUREMENT SYSTEM

The SUPERSPECTRA 3 is a thickness measurement system for analysing large area thin coatings and functional layers. Ist principble bases on the reflectometric measurement technique. This low energy optical principle is completely non-destructive.

 

The SUPERSPECTRA 3 identifies the thickness of transparent materials on a wide range of substrates. Combining nanometer thickness resolution with a topography analysis of large areas makes the SUPERSPECTRA 3 a versatile solution for many measuring applications.

SAMPLE HOLDER SEMI-TRANSPARENT MIRROR CAMERA SYSTEM LIGHT SOURCE
Fast Results

Fast Results

Fast Results

Short measurement time
Easy operation

Fast Results
High Precision

High Precision

High Precision

Nanometer thickness resolution

High Precision
Good Economy

Good Economy

Good Economy

Non destructive

Good Economy
Easy Upscaling

Easy Upscaling

Easy Upscaling

Inline option

Easy Upscaling
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Benefits

  • Compact size
  • Easy to operate
  • Non destructive
  • Fast measurement speed
  • Nanometer thickness resolution
  • Micrometer pixel resolution

Datasheet

Technical Data

Measurement format

100 mm x 150 mm

Thickness resolution

1 nm

Lateral resolution

25 µm

Dimensions

1450 mm x 600 mm x 500 mm

Weight

30 kg

Power supply

230 V – 50 / 60 Hz

Power supply

230 V – 50 / 60 Hz

Interface

USB

Parameters

Refractive index of the material

Absorbtion Coefficient of the material

Data Export

CSV • PNG • JPEG • Tiff • Mountain Maps

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